Ares J. Rosakis, California Institute of Technology
Mechanical Engineering
Professor
Pasadena, California
rosakis@aero.caltech.edu
Office:
(626) 395-4523
Expert In
Bio/Research
Professor Ares J. Rosakis, the Theodore von Kármán Professor of Aeronautics and Professor of Mechanical Engineering, is Chair of the Division of Engineering and Applied Science at Caltech. Before that he served as the fifth Director of the Graduate Aerospace Laboratories (GALCIT).
Dr. Ro...
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Dr. Ro...
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Bio/Research
Professor Ares J. Rosakis, the Theodore von Kármán Professor of Aeronautics and Professor of Mechanical Engineering, is Chair of the Division of Engineering and Applied Science at Caltech. Before that he served as the fifth Director of the Graduate Aerospace Laboratories (GALCIT).
Dr. Rosakis received his BA and MA degrees in Engineering Science from Oxford University in 1978. He went on to earn his Sc.M. and Ph.D. degrees in solid mechanics from Brown University. He joined Caltech and GALCIT as an Assistant Professor in 1982 where he currently is the Theodore von Kármán Professor of Aeronautics and Professor of Mechanical Engineering.
He is the author of more than 260 works on quasi-static and dynamic failure of metals, composites, and interfaces with emphasis on the use of high speed visible and IR diagnostics and laser interferometry for the study of dynamic fracture and dynamic localization. Professor Rosakis holds nine US patents on thin-film stress measurement and in situ wafer level metrology as well as on high speed infrared thermography.
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Dr. Rosakis received his BA and MA degrees in Engineering Science from Oxford University in 1978. He went on to earn his Sc.M. and Ph.D. degrees in solid mechanics from Brown University. He joined Caltech and GALCIT as an Assistant Professor in 1982 where he currently is the Theodore von Kármán Professor of Aeronautics and Professor of Mechanical Engineering.
He is the author of more than 260 works on quasi-static and dynamic failure of metals, composites, and interfaces with emphasis on the use of high speed visible and IR diagnostics and laser interferometry for the study of dynamic fracture and dynamic localization. Professor Rosakis holds nine US patents on thin-film stress measurement and in situ wafer level metrology as well as on high speed infrared thermography.
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